DocumentNumber Date Language Title
BSI BS CECC 00009 1982.04.30  Harmonized system of quality assessment for electronic components Basic specification: Basic testing procedures and measuring methods for electromechanical components
BSI BS CECC 00016 1991.01.01  Basic Specification: Basic Requirements for the Use of Statistical Process Control (SPC) in the CECC System (T)
BSI BS CECC 00108 1996.01.15  Rule of Procedure 8 Attestation of Conformity the CECC Mark and Conditions of Use, Certificates of Approval and Procedures for the Attestation of Conformity
BSI BS CECC 00111-0 1994.01.01  Rule of Procedure 11 Specifications Part 0: an Introduction to the Types of Specifications Applicable Within the CECC System (T)
BSI BS CECC 299 001 1999.11.15  Technology Approval Schedule - Manufacture of Electrical Connectors - CECC 299 001:1999;
BSI BS CECC 00804 1996.01.01  Harmonized System of Quality Assessment for Electronic Components Interpretation of 'EN ISO 9000: 1994' Reliability Aspects for Electronic Components (T)
BSI BS CECC 00808 1996.01.01  Harmonized System of Quality Assessment for Electronic Components Guidance Document: Use and Application of Plastic Encapsulated Devices (T)
BSI BS CECC 22000 1993.01.01  Generic Specification: Radio Frequency Coaxial Connectors (Parts I, II and III) (T)
BSI BS CECC 22110 1983.01.01  Radio Frequency Coaxial Connectors, Series SMA: Sectional Specification
BSI BS CECC 22111 1983.01.01  Specification for Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification Radio Frequency Coaxial Connectors, Series SMA
BSI BS CECC 22121 1981.11.01  Specification for Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification Radio Frequency Coaxial Connectors, Series BNC
BSI BS CECC 23100-003 1996.04.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Single and Double Sided Printed Boards with Plain Holes - AMD 9805; February, 1998;
BSI BS CECC 23100-801 1998.06.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Single and Double-Sided Printed Boards with Plain Holes - Supersedes BS EN 123100-800: 1992;
BSI BS CECC 23200-003 1996.04.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Single and Double Sided Printed Boards with Plated Through Holes - AMD 9806; February, 1998;
BSI BS CECC 23200-801 1998.06.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Single and Double-Sided Printed Boards with Plated Through Holes - Supersedes BS EN 123200-800: 1992;
BSI BS CECC 23300-003 1996.04.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Multilayer Printed Boards - AMD 9807; February, 1998
BSI BS CECC 23300-801 1998.06.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Multi-Layer Printed Boards - Supersedes BS EN 123300-800: 1992;
BSI BS CECC 23600-801 1998.06.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Flex-Rigid Multilayer Printed Boards with Through Connections
BSI BS CECC 23700-801 1998.06.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Flex-Rigid Double-Sided Printed Boards with Through Connections
BSI BS CECC 23800-801 1998.06.15  Harmonized System of Quality Assessment for Electronic Components Capability Detail Specification: Flexible Multilayer Printed Boards with Through Connections
BSI BS CECC 25300 1981.01.01  Magnetic Oxide Cores for Power Applications: Sectional Specification - Amd 1:September 30,1982
BSI BS CECC 30201 001 1981.01.01  Tantalum Capacitors with Solid Electrolyte Porous Anode Metal Case: Detail Specification: Basic Plus Additional
BSI BS CECC 30202 1988.01.01  Tantalum Capacitors with Non-Solid Electrolyte, Porous Anode: Blank Detail Specification - Superseded by BS EN 130202: 1998
BSI BS CECC 30300 1992.01.01  Sectional Specification: Aluminium Electrolytic Capacitors with Solid and Non-Solid Electrolyte - Superseded by BS EN 130300: 1998
BSI BS CECC 30301 024 1981.01.01  Aluminium Electrolytic Capacitors with Non- Solid Electrolyte. Long- Life Grade: Detail Specification: Full Plus Additional Assessment Level - Amd 1:March 31,1982
BSI BS CECC 30401 1985.01.01  Fixed Metallized Polyethylene Terephthalate Film Dielectric d.c. Capacitors: Blank Detail Specification
BSI BS CECC 30401 023 1979.01.01  Fixed Metallized Polyethylene Terephthalate Film d.c. Dielectric Capacitors Rectangular Non- Metallic Case: Detail Specification: Full Assessment - Amd 1:September 30,1982
BSI BS CECC 30401 033 1981.01.01  Fixed Metallized Polyethylene Terephthalate Film Dielectric d.c. Capacitors Rectangular Non-Metallic Case: Detail Specification: Full Assessment
BSI BS CECC 30500 1989.01.01  Fixed Metallized Polycarbonate Film Dielectric Capacitors for Direct Current - Superseded by BS EN 130500: 1998; Supersedes BS 9070: SEC 6: 1971
BSI BS CECC 30501 1993.01.01  Blank Detail Specification Fixed Metallized Polycarbonate Film Dielectric Capacitors for Direct Current - Superseded by BS EN 130501: 1998
BSI BS CECC 31201 1981.01.01  Fixed Capacitors with Metallized Electrodes and Polypropylene Dielectric: Blank Detail Specification - Amd 1:March 30,1984
BSI BS CECC 40101 019 1977.01.01  Fixed Low Power Non- Wirewound Resistors, Insulated. Typical Construction: Metal Oxide Film Helically Cut: Detail Specification: Full Assessment Level
BSI BS CECC 40300 1981.01.01  Fixed Precision Resistors: Sectional Specification
BSI BS CECC 40301 1988.01.01  Fixed Precision Resistors: Blank Detail Specification
BSI BS CECC 40302 1978.01.01  Fixed Precision Resistors (Assessment Level F) Blank Detail Specification
BSI BS CECC 41100 1978.01.01  Lead Screw Actuated and Rotary Preset Potentiometers: Sectional Specification - Amd 1:December 23,1987
BSI BS CECC 41102 1978.01.01  Preset Potentiometers: Blank Detail Specification: Assessment Level M
BSI BS CECC 41200 1979.01.01  Power Potentiometers: Sectional Specification
BSI BS CECC 41201 1978.11.01  Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S)
BSI BS CECC 41202 1978.11.01  Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M)
BSI BS CECC 41300 1979.01.01  Low Power Single-Turn Rotary Potentiometers: Sectional Specification
BSI BS CECC 41301 1979.01.01  Low Power Single Turn Rotary Potentiometers: (Assessment Level S): Blank Detail Specification (In Accordance with BS CECC 41300) (T)
BSI BS CECC 41302 1979.01.01  Low Power Single Turn Rotary Potentiometers: (Assessment Level M): Blank Detail Specification (In Accordance with BS CECC 41300) (T)
BSI BS CECC 41400 1980.01.01  Rotary Precision Potentiometers: Sectional Specification - Amd 1:December 30,1983
BSI BS CECC 41401 1979.12.01  Specification for harmonized system of quality assessment for electronic components. Blank detail specification: rotary precision potentiometers (assessment level S)
BSI BS CECC 42100 1978.01.01  Low Voltage Varistors Primarily for Telephony Applications: Sectional Specification - Amd 1:May 31,1982
BSI BS CECC 42101 1978.01.01  Low Voltage Varistors Primarily for Telephony Applications (Assessment Level P): Blank Detail Specification
BSI BS CECC 42200 1988.01.01  Surge Suppression Varistors
BSI BS CECC 42201 1988.01.01  Surge Suppression Varistors: Blank Detail Specification
BSI BS CECC 50000 1987.10.30  Harmonized system of quality assessment for electronic components  Generic specification: Discrete semiconductor devices - AMD 7012: October 1992;
BSI BS CECC 50000 SUPP 1 1983.05.31  Harmonized System of Quality Assessment for Electronic Components  Generic Specification: Discrete Semiconductor Devices  Supplement No. 1: CECC Assessed Process Average
BSI BS CECC 50008 1982.04.15  Ambient-Rated Rectifier Diodes - Remains Current
BSI BS CECC 50009 1982.08.15  Case-Rated Rectifier Diodes - Remains Current
BSI BS CECC 75101 1984.01.01  Two-Part and Edge Socket Connectors for Printed Board Application: Example Detail Specification/ Blank Detail Specification
BSI BS CECC 75201 1992.01.01  Blank Detail Specification Interim Example Detail Specification/Blank Detail Specification Circular Connectors for Frequencies Below 3 MHz
BSI BS CECC 75301 1992.09.01  Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz
BSI BS CECC 90101 1980.04.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?Digital integrated TTL circuits 鈥?Series 54, 64, 74, 84 - AMD 3945: February 1982; AMD 5198: August 1986; AMD 5616: April 1987; Remains Current
BSI BS CECC 90103 1980.04.01  Specification for Harmonized system of quality assessment for electronic components Family specification Digital Integrated TTL low power SCHOTTKY circuits Series 54LS, 64LS, 74LS, 84LS - AMD 3642: March 31, 1981
BSI BS CECC 90104 1990.12.01  Specification for Harmonized system of quality assessment for electronic components Family specification C. MOS digital integrated circuits Series 4000 B and 4000 UB - Amd 8290: August 15, 1994
BSI BS CECC 90105 1987.01.01  Blank Detail Specification: Fusible Link Programmable Bipolar Read Only Memories, Silicon Monolithic Integrated Circuits (AMD 8163) March 15, 1993 (T) - Amd 2;
BSI BS CECC 90111 1987.01.01  Blank Detail Specification: MOS Read/Write Static Memories Silicon Monolithic Circuits (AMD 8164) March 15, 1994 (T) - Amd 1;
BSI BS CECC 90112 1987.01.01  Blank Detail Specification: MOS Read/Write Dynamic Memories Silicon Monolithic Circuits (AMD 8165) March 15, 1994 (T) - Amd 1;
BSI BS CECC 90113 1987.01.01  MOS Ultra-Violet Light Erasable Electrically Programmable Read Only Memories Silicon Monolithic Circuits (AMD 5997) November 30, 1990 - Amd 1;
BSI BS CECC 90114 1990.01.01  Blank Detail Specification: Programmable Logic Arrays (PLA) (AMD 8166) March 15, 1994 (T) - Amd 1;
BSI BS CECC 90115 1994.01.01  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification Digital Array Integrated Circuits (T)
BSI BS CECC 90200 1988.02.19  Harmonized System of Quality Assessment for Electronic Components: Sectional Specification: Analogue Monolithic Integrated Circuits - AMD 8292: August 15, 1994
BSI BS CECC 90201 1990.01.01  AMD 1 Blank Detail Specification: Integrated Voltage Regulators (AMD 8291) August 15, 1994 (T)
BSI BS CECC 90202 1990.01.01  Blank Detail Specification: Integrated Operational Amplifiers - AMD 8293 August 15, 1994; Replaces BS CECC 90202: 1985;
BSI BS CECC 90203 1985.01.01  Integrated Analogue Switching Circuits: Blank Detail Specification
BSI BS CECC 90300 1988.01.01  Sectional Specification: Interface Monolithic Integrated Circuits (Read in Conjunction with BS CECC 90000) (T) - Amd 1:August 15,1994
BSI BS CECC 90301 1985.01.01  Blank Detail Specification: Integrated Line Transmitters and Receivers (AMD 8295) August 15, 1995 (T) - Amd 1;
BSI BS CECC 90302 1986.01.01  Blank Detail Specification: Integrated Voltage Comparators (AMD 8296) August 15, 1994 (T) - Amd 1;
BSI BS CECC 96000 1987.01.01  Electromechanical Switches: Generic Specification
BSI BS CECC 96100 1989.01.31  Harmonized system of quality assessment for electronic components 鈥?Sectional specification including blank detail specification: Rotary switches
BSI BS CECC 96200 1989.01.31  Harmonized system of quality assessment for electronic components 鈥?Sectional specification including blank detail specification: Lever switches
BSI BS CECC 96300 1989.01.31  Harmonized system of quality assessment for electronic components 鈥?Sectional specification including blank detail specification: Sensitive switches
BSI BS CECC 96400 1989.01.31  Harmonized system of quality assessment for electronic components 鈥?Sectional specification including blank detail specification: Push-button switches
BSI BS CECC 96601 2003.03.25  Blank Detail Specification: Slide switches
BSI BS CECC 96701 2003.03.25  Blank Detail Specification: Dual-in-line switches
BSI BS CECC 123400-003 1994.02.15  Harmonized System of Quality Assessment for Electronic Components: Capability Detail Specification: Flexible Printed Boards Without Through-Connections - AMD 9198 December 15,1996;
BSI BS CECC 123500-003 1994.02.15  Harmonized System of Quality Assessment for Electronic Components: Capability Detail Specification: Flexible Printed Boards with Through-Connections - AMD 9208; December 15, 1996;
BSI BS CECC 200025 1998.08.15  Harmonized System of Quality Assessment for Electronic Components; Process Assessment Schedule: Printed Board Assembly Facilities
BSI BS CECC 265001 1999.07.15  Harmonized System of Quality Assessment for Electronic Components Technology Approval Schedule: Film and Hybrid Integrated Circuits
BSI BS E9063 1976.09.01  Specification for Harmonized system of quality assessment for electronic components: Blank Detail Specification: Industrial Heating Triodes
BSI BS E9065 1976.09.01  Specification for Harmonized system of quality assessment for electronic components: Blank detail specification: Small power transmitting tubes of anode dissipation up to 1 kW
BSI BS EN 100014 1988.02.29  Harmonized system of quality assessment for electronic components 鈥?Basic specification: CECC assessed process average procedure (60 % confidence limit) - AMD 7195: October 1992
BSI BS EN 111000 1980.10.31  Harmonized system of quality assessment for electronic components Generic specification: Cathode ray tubes - AMD 6004: July 1992; AMD 7600: March 15, 1993
BSI BS EN 111001 1980.09.15  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification Cathode Ray Tubes - AMD 9098: August 1996
BSI BS EN 111100 1984.11.30  Harmonized system of quality assessment for electronic components: Sectional specification: Display storage tubes - AMD 7601: February 15, 1993
BSI BS EN 111101 1984.08.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Display storage tubes - AMD 9097: August 15, 1996;
BSI BS EN 112000 1980.12.31  Harmonized System of Quality Assessment for Electronic Components Generic Specification: Image Converter and Intensifier Tubes - AMD 6008: July 1992; AMD 9605: November 1997
BSI BS EN 112001 1980.11.15  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification: Image Converter and Image Intensifier Tubes - AMD 7572: October 15, 1997
BSI BS EN 113000 1981.01.30  Harmonized system of quality assessment for electronic components Generic specification 鈥?Camera tubes - AMD 7573: February 15, 1993
BSI BS EN 113001 1981.01.15  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification: Camera Tubes - AMD 7574: October 15, 1997
BSI BS EN 114000 1984.11.30  Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes - AMD 7575: February 1993
BSI BS EN 114001 1984.08.15  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification: Photomultiplier Tubes - AMD 7576: October 15, 1997
BSI BS EN 116000-2 1986.11.28  Generic Specification: Electromechanical All-or-Nothing Relays Part 2: Generic Data and Methods of Test for Time Delay Relays - AMD 8070: February 15, 1994; Renumbers BS CECC 16000-2:1986
BSI BS EN 116200 1992.05.01  Harmonized System of Quality Assessment for Electronic Components - Sectional Specification: Electromechanical All-or-Nothing Relays (Including Relays for Severe Environmental Conditions) - AMD 9627: October 1997
BSI BS EN 117000 1992.05.01  Harmonized system of quality assessment for electronic components - Generic specification: Solid state all-or-nothing relays of assessed quality. Generic data and methods of test - AMD 9626: October 1997
BSI BS EN 120001 1991.11.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor - AMD 8000: October 1993
BSI BS EN 120002 1988.06.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Infrared emitting diodes, infrared emitting diode arrays - AMD 8001: October 1993
BSI BS EN 120003 1986.11.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Phototransistors, photodarlington transistors, phototransistor arrays - AMD 8002: October 1993
BSI BS EN 120004 1988.05.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Ambient rated photocouplers with phototransistor output - AMD 8003: October 15, 1993
BSI BS EN 120005 1986.11.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Photodiodes, photodiode-arrays (not intended for fibre optic applications) - AMD 8004: October 1993
BSI BS EN 120006 1988.06.15  Specification for Harfmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Pin-photodiodes for fibre optic applications - AMD 8005: October 1993
BSI BS EN 120007 1991.11.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Liquid crystal displays Monochrome LCDs without electronic circuit - AMD 8006: October 1993
BSI BS EN 122120 1993.10.15  Harmonized System of Quality Assessment for Electronic Components Sectional Specification: Radio Frequency Coaxial Connectors Series BNC - AMD 9196: December 15, 1996
BSI BS EN 123000 1989.09.29  Add 1 Harmonized System of Quality Assessment for Electronic Components Generic Specification: Printed Boards - AMD 7145: May 1992; AMD 9249: September 1996; Addendum 1: August 15, 1997; Renumbers BS CEC 23000:1989
BSI BS EN 123100 1989.09.29  Harmonized system of quality assessment for electronic components Sectional specification: Single and double sided printed boards with plain holes - AMD 7358: November 1992; AMD 9250: September 15, 1996;
BSI BS EN 123200 1989.09.29  Harmonized system of quality assessment for electronic components Sectional specification: Single and double sided printed boards with plated through holes - AMD 7361: November 1992; AMD 9251: September 15, 1996
BSI BS EN 123300 1989.08.31  Harmonized System of Quality Assessment for Electronic Components - Sectional Specification: Multilayer Printed Boards - AMD 7062: July 1992; AMD 7364: November 15, 1992; AMD 9252: September 15, 1996
BSI BS EN 123400 1990.12.31  Harmonized system of quality assessment for electronic components Sectional specification: Flexible printed boards without through connections - AMD 7367: November 1992; AMD 9253: September 15, 1996;
BSI BS EN 123400-800 1991.12.20  Harmonized system of quality assessment for electronic components: Capability detail specification: Flexible printed boards without through-connections - AMD 7368: November 1992
BSI BS EN 123500 1990.11.30  Harmonized System of Quality Assessment for Electronic Components - Sectional Specification: Flexible Printed Boards with Through Connections - AMD 7369: November 15, 1992; AMD 9254: September 15, 1996; AMD 9754: December 1997
BSI BS EN 123500-800 1991.12.20  Harmonized system of quality assessment for electronic components: Capability detail specification: Flexible printed boards with through-connections - AMD 7370: November 1992
BSI BS EN 125100 1977.08.31  Harmonized system of quality assessment for electronic components Sectional specification: Magnetic oxide cores for inductor applications - AMD 7577: February 15, 1993
BSI BS EN 125200 1978.11.30  Harmonized system of quality assessment for electronic components Sectional specification: Magnetic oxide cores for linear transformers - AMD 7578: February 1993
BSI BS EN 125400 1984.09.28  Harmonized system of quality assessment for electronic components Sectional specification: Adjusters used with magnetic oxide cores for use in inductors and tuned transformers - AMD 7579: February 1993
BSI BS EN 125401 1984.12.15  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification: Adjusters Used with Magnetic Oxide (Ferrite) Cores for Use in Inductors and Tuned Transformers - AMD 7580: October 15, 1997; Renumbers BS CECC 25401:1984
BSI BS EN 135000 1978.02.28  Harmonized system of quality assessment for electronic components: Generic specification: Travelling wave amplifier tubes - AMD 5870: July 1988; AMD 7881: August 15, 1993
BSI BS EN 135001 1978.02.15  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification: C.W. Power Amplifier Travelling Wave Tubes up to 500 Watts - AMD 5862: May 31, 1988; AMD 7918: October 15, 1997; Renumbers BS CECC 35001: 1978
BSI BS EN 136000 1978.08.31  Harmonized system of quality assessment for electronic components Generic specification: Magnetrons - AMD 7581: February 15, 1993
BSI BS EN 136001 1977.10.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification: Pulsed magnetrons (excluding frequency agile magnetrons) - AMD 7582: August 1996
BSI BS EN 136002 1979.01.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?C.W. magnetrons for RF heating or cooking applications - AMD 9096: August 1996
BSI BS EN 143001 1984.01.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Directly heated negative temperature coefficient thermistors (Beads in solid glass or vitreous enamel) - AMD 7378: December 1992
BSI BS EN 143002 1984.01.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Directly heated negative temperature coefficient thermistors (Beads in envelopes) - AMD 7379: December 1992
BSI BS EN 143003 1984.01.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Directly heated negative temperature coefficient thermistors (Disc type) - AMD 7380: December 1992
BSI BS EN 143004 1984.01.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification: directly heated negative temperature coefficient thermistors (Rod type) - AMD 7381: December 1992
BSI BS EN 150001 1981.03.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?General purpose semiconductor diodes - AMD 7590: February 1993
BSI BS EN 150003 1976.08.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Case-rated bipolar transistors for low frequency amplification - AMD 3990: March 1982; AMD 7595: February 1993
BSI BS EN 150004 1976.08.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Bipolar transistors for switching applications - AMD 3992: March 1982; AMD 7596: February 1993
BSI BS EN 150006 1976.05.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Variable capacitance diode(s) - AMD 3995: March 1982; AMD 7597: February 1993
BSI BS EN 150007 1976.09.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Case-rated bipolar transistors for high frequency amplification - AMD 3996: March 1982; AMD 7598: February 1993
BSI BS EN 150008 1992.02.28  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Ambient-rated rectifier diodes - AMD 7698; June 15, 1993
BSI BS EN 150009 1992.02.28  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Case-rated rectifier diodes - AMD 7699: June 1993
BSI BS EN 150010 1983.02.15  Blank Detail Specification: Ambient Rated Thyristors - AMD 4354: June 1983; AMD 7591: February 1993; Supersedes BS CECC 50010: 1978
BSI BS EN 150011 1983.07.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Case-rated thyristors - AMD 7592: February 1993
BSI BS EN 150012 1978.02.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Single gate field-effect transistors - AMD 7593: February 1993
BSI BS EN 150013 1984.05.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Current regulator and current reference diodes - AMD 7594: February 1993
BSI BS EN 150014 1995.03.15  Harmonized system of quality assessment for electronic components Blank detail specification: Thyristor diodes, transient overvoltage suppressors - AMD 9310: January 15, 1997
BSI BS EN 150015 1992.05.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Unidirectional transient overvoltage suppressor diodes - AMD 7697: June 1993
BSI BS EN 160000 1992.09.15  Harmonized system of quality assessment for electronic components Generic specification: Modular electronic units - AMD 7860: August 1993; AMD 9311: January 1997
BSI BS EN 168101 1990.12.31  Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification: Quartz Crystal Units (Capability Approval) - AMD 9619: October 1997; Renumbers BS CECC 68101: 1990
BSI BS EN 168200 1991.05.31  Harmonized system of quality assessment for electronic components Sectional specification: Quartz crystal units (qualification approval) - AMD 9174: November 1996
BSI BS EN 175200 1997.04.15  Harmonized System of Quality Assessment for Electronic Components Sectional Specification: Circular Connectors
BSI BS EN 190100 1986.12.31  Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits - AMD 5562: December 1987; AMD 5954: March 1991; AMD 7845: July 1993
BSI BS EN 190101 1986.12.31  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?Digital integrated TTL circuits Series 54, 64, 74, 84 - AMD 8115: February 1994; AMD 8378: September 1994
BSI BS EN 190102 1990.04.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?Digital integrated TTL-SCHOTTKY circuits 鈥?Series 54S, 64S, 74S, 84S - AMD 8116: February 1994; AMD 8369: September 1994;
BSI BS EN 190103 1990.07.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?Digital integrated TTL low power SCHOTTKY circuits Series 54LS, 64LS, 74LS, 84LS - AMD 6764: June 1991; AMD 8117: February 1994; AMD 8370: September 1994
BSI BS EN 190106 1987.09.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?TTL advanced low power SCHOTTKY digital integrated circuits 鈥?Series 54 ALS, 74 ALS - AMD 8118: February 1994; AMD 8372: September 1994
BSI BS EN 190107 1987.09.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?TTL FAST digital integrated circuits 鈥?Series 54 F, 74 F - AMD 8119: February 1994; AMD 8371: September 1994
BSI BS EN 190108 1988.04.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Family specification 鈥?TTL advanced SCHOTTKY digital integrated circuits 鈥?Series 54 AS, 74 AS - AMD 8120: February 1994; AMD 8374: September 1994
BSI BS EN 190109 1990.01.31  Family Specification: Digital Integrated HC MOS Circuits Series HC/HCT/HCU   - (AMD 8375) September 15, 1994
BSI BS EN 190110 1993.12.15  Specification for Harmonized system of quality assessment for electronic components 鈥?Blank detail specification 鈥?Digital microprocessor integrated circuits - AMD 8376: September 15, 1994
BSI BS QC 200012 1996.12.15  Process assessment schedule for Printed board design facilities
CECC CEC 23 300-801 1998.02.01 German, English, French Capability Detail Specification: Multi-Layer Printed Boards - Supersedes EN 123 300-800:1992
CECC CEC 23 600-801 1998.02.01 German, English, French Capability Detail Specification: Flex-Rigid Multilayer Printed Boards with Through Connections
CECC CEC 23 700-801 1998.02.01 German, English, French Capability Detail Specification: Flex-Rigid Double-Sided Printed Boards with Through Connections
CECC CEC 23 800-801 1998.02.01 German, English, French Capability Detail Specification: Flexible Multilayer Printed Boards with Through Connections
CECC CECC 00 006 ISSUE 2 1981.01.01  Basic Specification: Environmental Test Procedures (En, Fr, Ge)
CECC CECC 00 007 ISSUE 2 1978.01.01  Basic Specification: Sampling Plans and Procedures for Inspection by Attributes (En, Fr, Ge)
CECC CECC 00 009 ISSUE 1 1980.01.01  Basic Specification: Basic Testing Procedures and Measuring Methods for Electromechanical Components (En, Fr, Ge)
CECC CECC 00 010 ISSUE 1 1980.01.01  Basic Specification: Printed Boards: Test Methods (En, Fr, Ge) AMD 1 (Fr, Ge)
CECC CECC 00 011 ISSUE 1 1982.01.01  Basic Specification: Calibration Requirements for the CECC System (En, Fr, Ge)
CECC CECC 00 012 ISSUE 1 1985.01.01  Basic Specification: Radiographic Inspection of Electronic Components (En, Fr, Ge)
CECC CECC 00 013 ISSUE 1 1984.01.01  Basic Specification: Scanning Electron Microscope Inspection of Semiconductor Dice (En, Fr, Ge)
CECC CECC 00 014 ISSUE 1 1986.01.01  Please Refer to EN Section of This Index
CECC CECC 00 015/ I ISSUE 1 1991.01.01  Please Refer to EN Section of This Index
CECC CECC 00 016 IS 1 1990.01.01  BASIC SPECIFICATION: BASIC REQUIREMENTS FOR THE USE OF STATISTICAL PROCESS CONTROL (SPC) IN THE CECC SYSTEM
CECC CECC 00 017 ISSUE 1 1994.01.01  Basic Specification: Microwave Common Modules for Use up to 20 GHz Interfaces, Fixings, Connection Protocol and Module Coding (En, Ge)
CECC CECC 00 100 ISSUE 2 1988.01.01  Basic Rules (En, Fr, Ge)
CECC CECC 00 101 ISSUE 5 1991.01.01  Rule of Procedure 1: the CENELEC Electronic Components Committee (En, Fr, Ge) AMD 1 (En, Fr, Ge) AMD 2 (En, Fr, Ge)
CECC CECC 00 102 ISSUE 2 1986.01.01  Rule of Procedure 2: Administration Procedures; Part I: Organisation of the CECC General Secretariat Part II: CECC Financial Administration (En, Fr, Ge) AMD 1 (En, Fr, Ge)
CECC CECC 00 103 ISSUE 2 1990.01.01  Rule of Procedure 3: the Electronic Components Quality Assurance Committee (En, Fr, Ge)
CECC CECC 00 104 ISSUE 1 1982.01.01  Rule of Procedure 4; CECC Working Groups; Part III: Preparation of Specifications under the Single Country Procedure - En, Fr, Ge
CECC CECC 00 104 ISSUE 4 1989.01.01  Rule of Procedure 4; CECC Working Groups; Partie I: General Rules Partie II: Additional Rules (En, Fr, Ge) NOTICE (En, Fr, Ge) AMD 1 (En, Fr, Ge) AMD 2 (En, Fr, Ge)
CECC CECC 00 105 ISSUE 6 1989.01.01  Rule of Procedure 5: CECC Membership Register (En, Fr, Ge)
CECC CECC 00 106 ISSUE 3 1991.01.01  Rule of Procedure 6: Amendments to the Rules of Procedure of the System (En, Fr, Ge)
CECC CECC 00 107/ PT I ISSUE 3 1982.01.01  Rule of Procedure 7: Quality Assessment Procedures; Part I: Quality Assessment Procedure for General Usage (En, Fr, Ge)
CECC CECC 00 107/ PT II IS 1 1979.01.01  Rule of Procedure 7: Quality Assessment Procedures Part II: Procedure for Enhanced Assessment of Quality (En, Fr, Ge) AMD 1 (En, Fr, Ge)
CECC CECC 00 107/ PT III IS 1 1980.01.01  Rule of Procedure 7: Quality Assessment Procedures Part III: Procedure for Capability Approval (En, Fr, Ge) AMD 1 (En, Fr, Ge)
CECC CECC 00 108 ISSUE 3 1994.01.01  Rule of Procedure 8: Attestation of Conformity Part I: the CECC Mark and Conditions of Use Part II: Certificates of Approval Part III: Procedures for the Attestation of Conformity (En, Fr, Ge)
CECC CECC 00 109 ISSUE 1 1974.01.01  Rule of Procedure 9: Certified Test Records (En, Fr, Ge)
CECC CECC 00 110 ISSUE 1 1994.01.01  Rule of Procedure 10; National Implementation of CECC Produced European Standards and Specifications (En, Fr, Ge)
CECC CECC 00 111/ 0 ISSUE 1 1993.01.01  Rule of Procedure 11 Specifications Part 0: Part 0: an Introduction to the Types of Specifications Applicable within the CECC System - En, Fr, Ge
CECC CECC 00 111/ I ISSUE 5 1994.01.01  Rule of Procedure 11; Specifications Part I: General Regulations for CECC Specifications (En, Fr, Ge)
CECC CECC 00 111/ II ISSUE 4 1991.01.01  Rule of Procedure 11: Specifications Part II: Regulations for CECC Specifications for Components of Enhanced Assessment of Quality (En, Fr, Ge)
CECC CECC 00 111/ III ISSUE 4 1991.01.01  Rule of Procedure 11: Specifications Part III: Regulations for CECC Specifications for Components for General and Professional (Civil and Military) Usage (Excluding Detail Specifications) (En, Fr, Ge) AMD 1 & 2 (En, Fr, Ge) AMD 3 & 4 (En, Fr, Ge)
CECC CECC 00 111/ IV ISSUE 4 1991.01.01  Rule of Procedure 11: Specifications Part IV: Regulations for CECC Detail Specifications (En, Fr, Ge) AMD 1 (En, Fr, Ge) AMD 2 (En, Fr, Ge)
CECC CECC 00 111/ V ISSUE 1 1991.01.01  Rule of Procedure 11: Specifications: Part V: Preparation of Specifications under the Single Originator Procedure - En, Fr, Ge
CECC CECC 00 111/ VI ISSUE 1 1994.01.01  Rule of Procedure 11 Specifications Part VI: Regulations for Process Assessment Schedules (PAS) (En, Fr, Ge)
CECC CECC 00 111/ VII ISSUE 1 1994.01.01  Rule of Procedure 11: Specifications; Part VII: Regulations for Component Specifications and Assessment Specifications (En, Fr, Ge)
CECC CECC 00 111/ VIII ISSUE 1 1994.01.01  Rule of Procedure 11 Specifications Part VIII: Regulations for Technology Approval Schedules (TAS) (En, Fr, Ge)
CECC CECC 00 112/ I ISSUE 3 1993.01.01  Rule of Procedure 12 Voting Procedures: Part I: CECC Rules of Procedure and Specifications (Excluding ENs) (En, Fr, Ge)
CECC CECC 00 112/ II ISSUE 1 1994.01.01  Rule of Procedure 12 Voting Procedures Part II: CECC European Standards (En, Fr, Ge)
CECC CECC 00 112 ISSUE 2 1982.01.01  Rule of Procedure 12: Voting Procedures (En, Fr, Ge) AMD 1 (En, Fr, Ge) AMD 2 (En, Fr, Ge) AMD 3 (En, Fr, Ge) AMD 4 (En, Fr, Ge)
CECC CECC 00 113 ISSUE 3 1993.01.01  Rule of Procedure 13: National Declaration of Implementation (DNM) (En, Fr, Ge)
CECC CECC 00 114/ 0 ISSUE 2 1994.01.01  Rule of Procedure 14; Quality Assessment Procedures Part 0: An Introduction to the Types of Approval Available under the CECC System - En, Fr, Ge
CECC CECC 00 114/ II IS 3 1994.01.01  Rule of Procedure 14: Quality Assessment Procedures; Part II: Qualification Approval of Electronic Components (En, Fr, Ge)
CECC CECC 00 114 PT I ISSUE 2 1992.01.01  Please Refer to EN Section of This Index
CECC CECC 00 114 PT III IS 2 1993.01.01  Rule of Procedure 14 Quality Assessment Procedures Part III: Capability Approval of an Electronic Component Manufacturing Activity (En, Fr, Ge) ERRATUM (En, Fr, Ge) AMD (En, Fr, Ge) - AMD 1 (En, Fr, Ge); Erratum (1993)
CECC CECC 00 114 PT IV IS 1 1991.01.01  Rule of Procedure 14 Quality Assessment Procedures Part IV: Procedure for Enhanced Assessment of Quality (En, Fr, Ge)
CECC CECC 00 114 PT V ISSUE 1 1993.01.01  Rule of Procedure 14: Quality Assessment Procedures: Part V: Process Approval of Specialist Contractors within the Electronic Components Industry - En, Fr, Ge; AMD 1 En, Fr, Ge; AMD 2 En, Fr, Ge
CECC CECC 00 200 ISSUE 1 2002.10.01 German, English, French Register of Approvals
CECC CECC 00 200 ISSUE 2 2000.02.01 German, English, French Register of Approvals
CECC CECC 00 300 ISSUE 1 1996.01.01  Register of National Documents; Implementing CECC Publications and CECC European Standards (En, Fr, Ge)
CECC CECC 00 300 ISSUE 2 1994.01.01  Register of National Documents; Implementing CECC Publications and CECC European Standards (En, Fr, Ge)
CECC CECC 00 301 ISSUE 1 1996.01.01  Register of CECC Specifications and Related Detail Specifications (En, Fr, Ge)
CECC CECC 00 400 ISSUE 3 1986.01.01  Handbook for the Production of CECC Documents (En) ERRATUM (En, Fr, Ge) AMD 1 (En, Fr, Ge) AMD 2 (En, Fr, Ge) AMD 4 (En, Fr, Ge) AMD 5 (En, Fr, Ge) AMD 6 (En, Fr, Ge) AMD 7 (En, Fr, Ge) AMD 8 (En, Fr, Ge)
CECC CECC 00 401 ISSUE 1 1991.01.01  Glossary of Abbreviations, Terms and Definitions of the CECC System (En, Fr, Ge) AMD 1 (En, Fr, Ge)
CECC CECC 00 500 ISSUE 3 N/A  CECC System for Electronic Components of Assessed Quality Introduction to the System (En)
CECC CECC 00 600 ISSUE 1 1982.01.01  Rules for the Use and Administration of the CECC Certification Mark (En, Fr, Ge)
CECC CECC 00 700 ISSUE 1 1984.01.01  Handbook of Administration (En) AMD 1 & ADDENDA (En) ADDENDA 2 (En) AMD 2 Thru AMD 9 (En)
CECC CECC 00 800 ISSUE 1 1986.01.01  Code of Practice on the Use of the PPM Approach in Association with the CECC System (En, Fr, Ge)
CECC CECC 00 801 ISSUE 1 1990.01.01  Preliminary Guidance Document: Pi-Q Factors of CECC Approved Components for Use in Reliability Predictions (En, Fr, Ge) AMD 1 (En, Fr, Ge)
CECC CECC 00 802 ISSUE 2 1994.01.01  Guidance Document: CECC Standard Method for the Specification of Surface Mounting Components (SMDs) of Assessed Quality (En, Ge)
CECC CECC 00 803 ISSUE 1 1995.08.01  Guidance Document: Visual Inspection of Soldered Surface Mounted Assemblies - En
CECC CECC 00 804 ISSUE 2 1996.01.01  Guidance Document: Interpretation of "EN ISO 9000:1994" Reliability Aspects for Electronic Components (En)
CECC CECC 00 806 ISSUE 1 1994.01.01  Guide to Total Quality Management (TQM) for CECC-Approved Organizations (En)
CECC CECC 00 808 1996.01.01  Guidance Document: Use and Application of Plastic Encapsulated Devices (En)
CECC CECC 00 809 ISSUE 1 1994.01.01  Guidance Document: Questionnaire for Auditing IC & ASIC Manufacturing Lines (Based on EN 190 000) (En)
CECC CECC 11 000 ISSUE 1 1980.01.01  Generic Specification: Cathode Ray Tubes (En, Fr, Ge) AMD 1 (En, Fr, Ge)
CECC CECC 11 001- 001 ISSUE 1 1983.01.01  BS CECC 11 001-001; Radar Display Projection Cathode Ray Tube (En)
CECC CECC 11 001- 004 ISSUE 1 1982.01.01  BS CECC 11 001-004; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 005 ISSUE 1 1984.01.01  BS CECC 11 001-005; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 006 ISSUE 1 1984.01.01  BS CECC 11 001-006; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 011 ISSUE 2 1985.01.01  BS CECC 11 001-011; Miniature High Resolution Cathode Ray Tube (En)
CECC CECC 11 001- 012 ISSUE 2 1985.01.01  BS CECC 11 001-012; Display Monitor Cathode Ray Tube Assembly (En)
CECC CECC 11 001- 013 ISSUE 2 1986.01.01  BS CECC 11 001-013; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 020 ISSUE 1 1983.01.01  BS CECC 11 001-020; Projection Cathode Ray Tube (En)
CECC CECC 11 001- 021 ISSUE 1 1983.01.01  BS CECC 11 001-021; Head-Up Display Cathode Ray Tube (En)
CECC CECC 11 001- 022 ISSUE 2 1986.01.01  BS CECC 11 001-022; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 023 ISSUE 1 1986.01.01  BS CECC 11 001-023; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 025 ISSUE 1 1984.01.01  BS CECC 11 001-025; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 026 ISSUE 2 1986.01.01  BS CECC 11 001-026; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 027 ISSUE 1 1984.01.01  BS CECC 11 001-027; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 028 ISSUE 1 1984.01.01  BS CECC 11 001-028; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 032 ISSUE 1 1984.01.01  BS CECC 11 001-032; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 037 ISSUE 1 1985.01.01  BS CECC 11 001-037; Miniature High Resolution Cathode Ray Tube Package (En)
CECC CECC 11 001- 038 ISSUE 2 1991.01.01  BS CECC 11 001-038; Miniature High Resolution Cathode Ray Tube (En)
CECC CECC 11 001- 040 ISSUE 1 1987.01.01  BS CECC 11 001-040; Radar Display Cathode Ray Tube (En)
CECC CECC 11 001- 041 ISSUE 1 1987.01.01  BS CECC 11 001-041; Miniature High Resolution Cathode Ray Tube Package (En)
CECC CECC 11 001- 042 ISSUE 1 1988.01.01  BS CECC 11 001-042; Radar Display Cathode Ray Tube Package (En)
CECC CECC 11 001- 044 ISSUE 1 1990.01.01  BS CECC 11 001-044; Miniature High Resolution Cathode Ray Tube Package (En)
CECC CECC 11 001 ISSUE 1 1986.01.01  Please Refer to EN Section in This Index
CECC CECC 11 100 ISSUE 1 1984.01.01  Please Refer to EN Section of This Index
CECC CECC 11 101 ISSUE 1 1984.01.01  Renumbered by EN 111101 Please Refer to EN Section in This Index
CECC CECC 12 000 ISSUE 1 1980.01.01  Please Refer to EN Section of this Index
CECC CECC 12 001- 001 ISSUE 1 1986.01.01  BS CECC 12 001-001; Image Intensifier: 3-Stage Cascade Tube for Night Vision Equipment with Enhanced MTF (En)
CECC CECC 12 001- 006 ISSUE 1 1984.01.01  BS CECC 12 001-006; Image Intensifier: Single Stage Proximity Focussed Inverting Tube for Night Vision Goggles, Incorporating an S25 Photocathode and a Micro-Channel Plate (En)
CECC CECC 12 001- 007 ISSUE 1 1984.01.01  BS CECC 12 001-007; Image Intensifier: Inverting Proximity Focused Tube for Night Vision Equipment, Incorporating a Gallium Arsenide Photo-Cathode and a Filmed Micro-Channel Plate (En)
CECC CECC 13 000 ISSUE 1 1980.01.01  Please Refer to EN Section of This Index
CECC CECC 14 000 ISSUE 1 1984.01.01  Please Refer to EN Section of This Index
CECC CECC 16 000 ISSUE 1 1986.01.01  Please Refer to EN Section of This Index
CECC CECC 16 000 ISSUE 2 1990.01.01  Generic Specification: Electromechanical All-Or-Nothing Relays; Part I: General (En, Fr, Ge) ERRATUM (En, Fr, Ge) AMD 1 (En, Fr, Ge) AMD 2 (En, Fr, Ge)
CECC CECC 16 100 ISSUE 1 1979.01.01  Sectional Specification: Electromechanical All-Or-Nothing Relays (En, Fr, Ge)
CECC CECC 16 101- 001 ISSUE 1 1987.01.01  BS CECC 16 101-001; Electromechanical All-Or-Nothing Relay; Polarized Monostable Hermetically Sealed with Internal ARC Barriers; Hooked or Straight Termination (En)
CECC CECC 16 101- 003 ISSUE 3 1994.01.01  BS CECC 16 101-003; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight Terminations; Test Schedule 3 with Additions (Including AMD 1) (En)
CECC CECC 16 101- 003 ISSUE 3 1982.01.01  CNR CEI CECC 16 101-003; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight Terminations; Test Schedule 3 with Additions (En)
CECC CECC 16 101- 004 ISSUE 3 1982.01.01  CNR CEI CECC 16 101-004; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight Terminations; Test Schedule 3 with Additions (En)
CECC CECC 16 101- 004 ISSUE 3 1994.01.01  BS CECC 16 101-004; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight Terminations; Test Schedule 3 with Additions (Includes AMD 1) (En)
CECC CECC 16 101- 005 ISSUE 3 1982.01.01  CNR CEI CECC 16 101-005; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight Terminations; Test Schedule 3 with Additions (En)
CECC CECC 16 101- 006 ISSUE 3 1982.01.01  CNR CEI CECC 16 101-006; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight Terminations; Test Schedule 3 with Additions (En)
CECC CECC 16 101- 007 ISSUE 3 1982.01.01  CNR CEI CECC 16 101-007; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight or Hooked Terminations; Test Schedule 3 with Additions (En)
CECC CECC 16 101- 008 ISSUE 4 1988.01.01  CEI CECC 16 101-008; Two Pole Changeover Contact Arrangement (2 Form C); Light Duty with Low Level Switching Capability; Solderable Straight or Hooked Terminations; Test Schedule 3 with Additions (En)
CECC CECC 16 101- 011 ISSUE 3 1985.01.01  All or Nothing Relays; Type: Half Cubic Inch - 2 PDT - 10 Amp - Relay (En)
CECC CECC 16 101- 012 ISSUE 3 1985.01.01  All or Nothing Relays; Type: One Cubic Inch - 4 PDT - 10 Amp - Relay (En)
CECC CECC 16 101- 014 ED 2 N/A  UTE C 45-310; Electromechanical All-Or-Nothing Relays (Fr)
CECC CECC 16 101- 015 ED 2 N/A  UTE C 45-310; Electromechanical All-Or-Nothing Relays (Fr)
CECC CECC 16 101- 016 ED 3 N/A  UTE C 45-310; Electromechanical All-Or-Nothing Relays (Fr)
CECC CECC 16 101- 018 ED 3 N/A  UTE C 45-310; Electromechanical All-Or-Nothing Relays (Fr)
CECC CECC 16 101- 019 ED 3 N/A  UTE C 45-310; Electromechanical All-Or-Nothing Relays (Fr)
CECC CECC 16 101- 020 ED 2 1987.01.01  UTE C 45-310 ADD 1; Electromechanical All-Or-Nothing Relays (Fr) ADD 1 (Fr)
CECC CECC 16 101- 021 ISSUE 1 N/A  BS CECC 16 101-021; Electromechanical All or Nothing Relays; Half Crystal Can Relay Hermetically Sealed, 2 Pole Changeover Contacts Light Duty with Low Level Capability; Solderable Straight or Hooked Terminations (En)
CECC CECC 16 101- 023 ED 2 1992.12.01  UTE C 45-310; Electromechanical All-Or-Nothing Relays (Fr)